Invention Grant
- Patent Title: Ion trap mass spectrometer
- Patent Title (中): 离子阱质谱仪
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Application No.: US13522458Application Date: 2010-11-24
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Publication No.: US09082604B2Publication Date: 2015-07-14
- Inventor: Anatoly Verenchikov
- Applicant: Anatoly Verenchikov
- Applicant Address: US MI St. Joseph
- Assignee: LECO Corporation
- Current Assignee: LECO Corporation
- Current Assignee Address: US MI St. Joseph
- Agency: Honigman Miller Schwartz and Cohn LLP
- Priority: GB1000649.2 20100115
- International Application: PCT/IB2010/055395 WO 20101124
- International Announcement: WO2011/086430 WO 20110721
- Main IPC: H01J49/28
- IPC: H01J49/28 ; H01J49/42 ; H01J49/40

Abstract:
Electrostatic trap mass spectrometers are disclosed that may comprise at least two parallel sets of electrodes separated by a field-free space, wherein said at least two parallel electrode sets extend along a curved Z-direction locally orthogonal to said X-Y plane such that each of said two electrode sets define a volume with a two-dimensional electrostatic field in an X-Y plane and define either planar or torroidal field regions; means for adjusting the torroidal field regions to provide both (i) stable trapping of ions passing between said fields within said X-Y plane and (ii) isochronous repetitive ion oscillations within said X-Y plane such that the stable ion motion does not require any orbital or side motion; and an ion bounding means in the curved Z-direction configured to compensate time-of-flight distortions at Z-edges of the trap.
Public/Granted literature
- US20130068942A1 Ion Trap Mass Spectrometer Public/Granted day:2013-03-21
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