Invention Grant
US09082674B2 Microelectronic package with stress-tolerant solder bump pattern 有权
微电子封装,具有耐应力焊料凸块图案

Microelectronic package with stress-tolerant solder bump pattern
Abstract:
A microelectronic package includes larger diameter solder bumps and smaller diameter solder bumps for coupling an interposer to a packaging substrate. The larger diameter solder bumps are positioned on a peripheral surface of the interposer and the smaller diameter solder bumps are positioned on a center surface of the interposer. The solder bumps positioned in the peripheral region can more reliably withstand the higher mechanical stresses that occur in this peripheral region during operation of the microelectronic package.
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