Invention Grant
US09082803B2 Substrate holding apparatus, mask alignment method, and vacuum processing apparatus using long taper pins and short taper pins for alignment
有权
基板保持装置,掩模对准方法和使用长锥销和用于对准的短锥销的真空处理装置
- Patent Title: Substrate holding apparatus, mask alignment method, and vacuum processing apparatus using long taper pins and short taper pins for alignment
- Patent Title (中): 基板保持装置,掩模对准方法和使用长锥销和用于对准的短锥销的真空处理装置
-
Application No.: US12850706Application Date: 2010-08-05
-
Publication No.: US09082803B2Publication Date: 2015-07-14
- Inventor: Yoshimitu Shimane , Nobuo Yamaguchi
- Applicant: Yoshimitu Shimane , Nobuo Yamaguchi
- Applicant Address: JP Kawasaki-shi
- Assignee: CANON ANELVA CORPORATION
- Current Assignee: CANON ANELVA CORPORATION
- Current Assignee Address: JP Kawasaki-shi
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2009-193748 20090825
- Main IPC: H01L21/68
- IPC: H01L21/68 ; C23C14/04 ; H01J37/34

Abstract:
A mask alignment method for a substrate holding apparatus. A first engaging portion is formed in one of a substrate holder and a mask and has two protruding portions. A second engaging portion is formed in the other one of the substrate holder and the mask and has at least one protruding portion. First groove portions formed in the other one of the substrate holder and the mask engage with the protruding portions of the first engaging portion. A second groove portion formed in the other one of the substrate holder and the mask engages with the protruding portion of the second engaging portion. The mask alignment method includes the steps of (a) engaging the protruding portions of the first engaging portion with the first groove portions to align the mask with respect to the substrate holder in a first direction, and (b) engaging, after the step of engaging the protruding portions of the first engaging portion with the first groove portions, the protruding portion of the second engaging portion with the second groove portion, to align the mask with respect to the substrate holder in a direction perpendicular to the first direction.
Public/Granted literature
- US20110051115A1 Substrate Holding Apparatus, Mask Alignment Method, and Vacuum Processing Apparatus Public/Granted day:2011-03-03
Information query
IPC分类: