Invention Grant
- Patent Title: Analog-to-digital converter and self-diagnosis method for analog-to-digital converter
- Patent Title (中): 用于模数转换器的模数转换器和自诊断方法
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Application No.: US14489029Application Date: 2014-09-17
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Publication No.: US09083367B2Publication Date: 2015-07-14
- Inventor: Kazuyuki Arai , Isao Sezaki
- Applicant: Renesas Electronics Corporation
- Applicant Address: JP Kawasaki-shi, Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kawasaki-shi, Kanagawa
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2012-240133 20121031
- Main IPC: H03M1/10
- IPC: H03M1/10 ; H03M1/46

Abstract:
An n-bit analog-to-digital converter includes a comparator that compares an analog input voltage with a comparison voltage; and a digital-to-analog converter that generates the comparison voltage in response to a result of the comparator, wherein the analog-to-digital converter outputs n-bit digital data corresponding to the analog input voltage, and wherein the analog-to-digital converter outputs a self-diagnosis result in such a way that the digital-to-analog converter generates a self-diagnosis voltage in response to the n-bit digital data and the comparator compares the analog input voltage with the self-diagnosis voltage.
Public/Granted literature
- US20150002323A1 ANALOG-TO-DIGITAL CONVERTER AND SELF-DIAGNOSIS METHOD FOR ANALOG-TO-DIGITAL CONVERTER Public/Granted day:2015-01-01
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