Invention Grant
- Patent Title: Eye examining instrument
- Patent Title (中): 眼睛检查仪器
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Application No.: US13959295Application Date: 2013-08-05
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Publication No.: US09084540B2Publication Date: 2015-07-21
- Inventor: Tobias Nef , René Mueri , Philipp Gloor , Urs Mosimann
- Applicant: Haag-Streit AG
- Applicant Address: CH Koeniz
- Assignee: HAAG-STREIT AG
- Current Assignee: HAAG-STREIT AG
- Current Assignee Address: CH Koeniz
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: CH1286/12 20120806
- Main IPC: A61B3/024
- IPC: A61B3/024 ; A61B3/10 ; A61B3/032 ; A61B3/00

Abstract:
An eye examining instrument comprises a projection device and a concave screen. The eye examining instrument furthermore comprises a convex reflector, wherein an image can be projected by the projection device onto the convex reflector and reflected by the convex reflector onto the concave screen.
Public/Granted literature
- US20140036230A1 EYE EXAMINING INSTRUMENT Public/Granted day:2014-02-06
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