Invention Grant
US09084552B2 Apparatus and method for influencing and/or detecting magnetic particles
有权
用于影响和/或检测磁性颗粒的装置和方法
- Patent Title: Apparatus and method for influencing and/or detecting magnetic particles
- Patent Title (中): 用于影响和/或检测磁性颗粒的装置和方法
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Application No.: US13392220Application Date: 2010-09-06
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Publication No.: US09084552B2Publication Date: 2015-07-21
- Inventor: Sven Biederer , Timo Frederik Sattel , Tobias Knopp , Thorsten Manuel Buzug
- Applicant: Sven Biederer , Timo Frederik Sattel , Tobias Knopp , Thorsten Manuel Buzug
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips N.V.
- Current Assignee: Koninklijke Philips N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP09170076 20090911
- International Application: PCT/IB2010/053995 WO 20100906
- International Announcement: WO2011/030275 WO 20110317
- Main IPC: A61B5/05
- IPC: A61B5/05 ; A61N2/02
Abstract:
The present invention relates to an MPI (Magnetic Particle Imaging) apparatus and a method for influencing and/or detecting magnetic particles in a field of view. Rather than moving the FFP (field free point) along a single, time-consuming high density trajectory it is proposed to use a number of low density trajectories with travelling phase, wherein each of said low density trajectories has the form of a closed curve differently located within the field of view.
Public/Granted literature
- US20120153949A1 APPARATUS AND METHOD FOR INFLUENCING AND/OR DETECTING MAGNETIC PARTICLES Public/Granted day:2012-06-21
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