The present disclosure is generally directed to a rapid configuration adapter system, method and assembly for testing integrated circuit devices including a test circuit board configured to connect to an integrated circuit test device and an interconnect board configured to receive and electrically connect to the test circuit board. The assembly further includes an interface board configured to connect to an external a controller, processor or data collection equipment, and configured to receive and electrically connect to the interconnect board. The assembly further includes a connections board configured to receive electrical connections thereon and configured to receive and electrically connect to the interface board, the connections board being further configured to accept electrical connections thereupon specific to the test circuit board.