Invention Grant
- Patent Title: Atmospheric measurement system and method
- Patent Title (中): 大气测量系统及方法
-
Application No.: US13983511Application Date: 2011-02-02
-
Publication No.: US09086488B2Publication Date: 2015-07-21
- Inventor: Peter Tchoryk, Jr. , David Michael Zuk , David Keith Johnson , Charles J. Richey , Parviz Tayebati
- Applicant: Peter Tchoryk, Jr. , David Michael Zuk , David Keith Johnson , Charles J. Richey , Parviz Tayebati
- Applicant Address: US MI Ann Arbor
- Assignee: Michigan Aerospace Corporation
- Current Assignee: Michigan Aerospace Corporation
- Current Assignee Address: US MI Ann Arbor
- Agency: Bacon & Thomas PLLC
- Agent Juan Carlos A. Marquez
- International Application: PCT/US2011/023516 WO 20110202
- International Announcement: WO2012/105973 WO 20120809
- Main IPC: G01S17/95
- IPC: G01S17/95 ; G01S17/58 ; G01N21/45 ; G01N21/53 ; G01S17/00

Abstract:
One of first and second beams (28) of corresponding first and second light (13) are projected into an atmosphere (20) and at least one physical property of the atmosphere (20) is detected from the interference pattern (47) generated from the resulting scattered light (30). The first and second beams (20) are selected responsive to either a detected signal-to-noise ratio (SNR) or a detected aerosol-to-molecular ratio (AMR). The wavelength (740) of the first light (13) provides for either molecular or aerosol scattering, whereas the wavelength (738) of the second light (13) provides for primarily only aerosol scattering. In accordance with a second aspect, scattered light (30) from one or more beams (28) of substantially monochromatic light (13) projected into the atmosphere (20) and received from a plurality of interaction regions (17) or measurement volumes (52) provides for determining wind power (P*) within a region of the atmosphere (20).
Public/Granted literature
- US20130314694A1 ATMOSPHERIC MEASUREMENT SYSTEM AND METHOD Public/Granted day:2013-11-28
Information query