Invention Grant
- Patent Title: High-sensitivity X-ray detector
- Patent Title (中): 高灵敏度X射线探测器
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Application No.: US13766794Application Date: 2013-02-14
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Publication No.: US09086493B2Publication Date: 2015-07-21
- Inventor: Rolf Kaufmann , Peter Seitz
- Applicant: CSEM—Centre Suisse d'Electronique et de Microtechnique SA—Recherche et Developpement
- Applicant Address: CH Neuchatel
- Assignee: CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE SA-RECHERCHE ET DEVELOPPEMENT
- Current Assignee: CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE SA-RECHERCHE ET DEVELOPPEMENT
- Current Assignee Address: CH Neuchatel
- Agency: Pearne & Gordon LLP
- Main IPC: G01T1/20
- IPC: G01T1/20

Abstract:
A device for the sensitive detection of X-rays comprises a structured scintillator screen optically coupled to a semiconductor image sensor. The scintillator screen comprises individual columnar elements covered with material showing high optical reflection. Each columnar element represents a pixel, and light flashes created by an X-ray photon in a scintillating event exit through a short surface of the columnar element for detection with a semiconductor image sensor. The semiconductor image sensor comprises a multitude of photosensor elements, and one or more of these photosensor elements receives light from a scintillator screen pixel. Each photosensor element of the image sensor comprises a semiconductor volume where photocharge is created, a lateral drift-field device for the collection of photocharge, an electronic detection circuit for the conversion of collected photocharge packets either into proportional voltage pulses, into binary signals indicating the arrival of X-ray photons or into digital signals whose values correspond to the energy of the incident X-ray photons.
Public/Granted literature
- US20130206994A1 HIGH-SENSITIVITY X-RAY DETECTOR Public/Granted day:2013-08-15
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