Invention Grant
- Patent Title: Wear-out equalization techniques for multiple functional units
- Patent Title (中): 多功能单元的磨损均衡技术
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Application No.: US13723304Application Date: 2012-12-21
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Publication No.: US09087146B2Publication Date: 2015-07-21
- Inventor: Stefan Rusu , Zhiguo Wang , Krishnakanth V. Sistla
- Applicant: Stefan Rusu , Zhiguo Wang , Krishnakanth V. Sistla
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Lowenstein Sandler LLP
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/34

Abstract:
Wear-out equalization techniques for multiple functional hardware units are disclosed. An integrated circuit includes a power control unit (PCU) configured to monitor indicators of wear-out incurred by multiple functional hardware units of the integrated circuit. The PCU calculates cumulative wear-out metrics of the functional hardware units based on the monitored indicators and performs an equalization action to equalize the cumulative wear-out metrics of the functional hardware units.
Public/Granted literature
- US20140181596A1 WEAR-OUT EQUALIZATION TECHNIQUES FOR MULTIPLE FUNCTIONAL UNITS Public/Granted day:2014-06-26
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