Invention Grant
US09087542B1 Method for providing a structure having reduced voids in a magnetic recording transducer 有权
提供在磁记录传感器中具有减小的空隙的结构的方法

Method for providing a structure having reduced voids in a magnetic recording transducer
Abstract:
A method for fabricating a structure in a magnetic recording transducer is described. A trench having sidewalls converging in a corner and a depth is formed. A dielectric layer is deposited using physical vapor deposit (PVD). The dielectric layer thickness is not more than one-half of the trench depth. A remaining portion of the trench is unfilled by the dielectric layer and has a top and a bottom. A portion of the dielectric layer is plasma etched. The plasma etch removes the portion of the dielectric layer at the top of the trench at a first rate and removes the portion of the dielectric layer at the bottom of the remaining portion of the trench at a second rate less than the first rate. An additional dielectric layer is deposited, also using PVD. The plasma etch and additional dielectric layer depositing steps are optionally repeated until the trench is filled.
Information query
IPC分类:
H 电学
H01 基本电气元件
H01L 半导体器件;其他类目中不包括的电固体器件(使用半导体器件的测量入G01;一般电阻器入H01C;磁体、电感器、变压器入H01F;一般电容器入H01G;电解型器件入H01G9/00;电池组、蓄电池入H01M;波导管、谐振器或波导型线路入H01P;线路连接器、汇流器入H01R;受激发射器件入H01S;机电谐振器入H03H;扬声器、送话器、留声机拾音器或类似的声机电传感器入H04R;一般电光源入H05B;印刷电路、混合电路、电设备的外壳或结构零部件、电气元件的组件的制造入H05K;在具有特殊应用的电路中使用的半导体器件见应用相关的小类)
H01L21/00 专门适用于制造或处理半导体或固体器件或其部件的方法或设备
H01L21/02 .半导体器件或其部件的制造或处理
H01L21/04 ..至少具有一个跃变势垒或表面势垒的器件,例如PN结、耗尽层、载体集结层
H01L21/18 ...器件有由周期表Ⅳ族元素或含有/不含有杂质的AⅢBⅤ族化合物构成的半导体,如掺杂材料
H01L21/30 ....用H01L21/20至H01L21/26各组不包含的方法或设备处理半导体材料的(在半导体材料上制作电极的入H01L21/28)
H01L21/31 .....在半导体材料上形成绝缘层的,例如用于掩膜的或应用光刻技术的(密封层入H01L21/56);以及这些层的后处理;这些层的材料的选择
H01L21/3105 ......后处理
H01L21/311 .......绝缘层的刻蚀
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