Invention Grant
- Patent Title: Metrics to identify image smoothness
- Patent Title (中): 指标图像平滑度
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Application No.: US13954143Application Date: 2013-07-30
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Publication No.: US09092854B2Publication Date: 2015-07-28
- Inventor: Oren Haik , Tal Frank , Tamar Kashti
- Applicant: HEWLETT-PACKARD INDIGO B.V.
- Applicant Address: NL Maastricht
- Assignee: Hewlett-Packard Indigo B.V.
- Current Assignee: Hewlett-Packard Indigo B.V.
- Current Assignee Address: NL Maastricht
- Main IPC: G06K9/40
- IPC: G06K9/40 ; G06T5/00

Abstract:
A system includes a structure module, graininess module, mottle module, and standard deviation (STD) module. The structure module is to identify a structure metric based on an input digital image, and remove a structured nonuniformity from the input digital image to produce a second input digital image. The graininess module is to identify a graininess metric based on the second input digital image. The mottle module is to identify a mottle metric based on the second input digital image. The STD module is to identify a STD metric that is to correspond to overall smoothness of the input digital image.
Public/Granted literature
- US20150036946A1 METRICS TO IDENTIFY IMAGE SMOOTHNESS Public/Granted day:2015-02-05
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