Invention Grant
- Patent Title: Resistance change type memory
- Patent Title (中): 电阻变化型存储器
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Application No.: US13965142Application Date: 2013-08-12
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Publication No.: US09093148B2Publication Date: 2015-07-28
- Inventor: Kosuke Hatsuda
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz, Goodman & Chick PC
- Main IPC: G11C13/00
- IPC: G11C13/00 ; G11C11/16

Abstract:
According to one embodiment, a resistance change type memory includes a first and a second bit lines, a memory cell connected between the first and second bit lines and including a variable resistance element as a memory element and a first select element including a first control terminal connected to a word line, and an auxiliary circuit connected to the first bit line and including a second select element including a second control terminal connected to a control line. When data is read from the memory cell, a first current in a read current supplied to the first bit line is supplied to the memory element and the first select element, and a second current in the read current is supplied to the second select element.
Public/Granted literature
- US20140286077A1 RESISTANCE CHANGE TYPE MEMORY Public/Granted day:2014-09-25
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