Invention Grant
- Patent Title: Tilt minimization through intensity control of light source
- Patent Title (中): 通过光源的强度控制来倾斜最小化
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Application No.: US13956222Application Date: 2013-07-31
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Publication No.: US09097517B2Publication Date: 2015-08-04
- Inventor: Colin Farrell
- Applicant: Colin Farrell
- Applicant Address: US CA Santa Barbara
- Assignee: BRUKER NANO INC.
- Current Assignee: BRUKER NANO INC.
- Current Assignee Address: US CA Santa Barbara
- Agent Antonio R. Durando
- Main IPC: G03B13/36
- IPC: G03B13/36 ; G01B11/26 ; G02B7/38 ; G02B21/24

Abstract:
The power input to the light source of a microscope is varied as necessary to maintain a constant degree of detector saturation as the objective is moved toward a best-focus position. Focus is found by tracking the source's intensity necessary to maintain the detector irradiance at a constant level. The in-focus position is reached when the power input (and correspondingly the intensity of the light emitted by the source) reaches a minimum. The concept can be applied in a similar manner to minimize or eliminate tilt in a sample.
Public/Granted literature
- US20130314718A1 TILT MINIMIZATION THROUGH INTENSITY CONTROL OF LIGHT SOURCE Public/Granted day:2013-11-28
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