Invention Grant
- Patent Title: Layered probes with core
- Patent Title (中): 带核心的分层探头
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Application No.: US12703063Application Date: 2010-02-09
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Publication No.: US09097740B2Publication Date: 2015-08-04
- Inventor: January Kister
- Applicant: January Kister
- Applicant Address: US CA Livermore
- Assignee: FormFactor, Inc.
- Current Assignee: FormFactor, Inc.
- Current Assignee Address: US CA Livermore
- Agency: Peacock Myers, P.C.
- Agent Deborah A. Peacock; Philip D. Askenazy
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R1/067

Abstract:
A probe for testing an electrical device under test. The probe has at least two outer layers and a core layer that is highly conductive. The core layer is disposed between the outer layers.
Public/Granted literature
- US20100182031A1 Layered Probes With Core Public/Granted day:2010-07-22
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