Invention Grant
- Patent Title: Synchronized voltage scaling and device calibration
- Patent Title (中): 同步电压缩放和设备校准
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Application No.: US13218116Application Date: 2011-08-25
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Publication No.: US09098438B2Publication Date: 2015-08-04
- Inventor: Jose Luis Flores , Lewis Nardini , Ritesh Sojitra , Denis Roland Beaudoin
- Applicant: Jose Luis Flores , Lewis Nardini , Ritesh Sojitra , Denis Roland Beaudoin
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Robert D. Marshall, Jr.; Frank D. Cimino
- Main IPC: G06F1/32
- IPC: G06F1/32 ; G06F13/14

Abstract:
A method is provided for scaling voltage in an integrated circuit. A calibration operation is performed on a functional module on the integrated circuit periodically at a rate T1. At least one parameter on the integrated circuit in monitored to determine when a performance threshold is reached. A change is initiated to an operating voltage for a portion of the integrated circuit in response to reaching the threshold. The rate of performing calibration operation is increased to a higher rate T2 for a window of time W in response to initiating the change in operating voltage, after which the rate of performing calibration is returned to the rate T1.
Public/Granted literature
- US20120084575A1 Synchronized Voltage Scaling and Device Calibration Public/Granted day:2012-04-05
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