Invention Grant
- Patent Title: Test system, test method, and test device
- Patent Title (中): 测试系统,测试方法和测试设备
-
Application No.: US13933664Application Date: 2013-07-02
-
Publication No.: US09098605B2Publication Date: 2015-08-04
- Inventor: Kazunori Kitagawa
- Applicant: ANRITSU CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: ANRITSU CORPORATION
- Current Assignee: ANRITSU CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Pearne & Gordon LLP
- Priority: JP2012-205136 20120919
- Main IPC: G06F11/32
- IPC: G06F11/32 ; H04W24/08

Abstract:
To prevent the complete omission of a log due to log information which is destroyed since it cannot be transmitted, when the communication log information of a plurality of layers is transmitted and a log is displayed at a transmission destination. A test device 10 includes a log header generating unit 151 that generates a log header including layer identification information and time information, a log data generating unit 152 that generates log data including communication data, a test-device-side transmitting unit 17 that transmits the log header and the log data to a display device 30, and a priority control unit 19 that performs control such that the log header is transmitted prior to the log data. A display control unit 35 of the display device 30 displays a log such that the log header is associated with the log data.
Public/Granted literature
- US20140082435A1 TEST SYSTEM, TEST METHOD, AND TEST DEVICE Public/Granted day:2014-03-20
Information query