A method for modeling metal routing includes extracting physical parameters of a metal interconnect for a circuit design, determining a resistance value from a database of metal interconnects with the extracted physical parameters, the resistance value being at a maximum frequency of a frequency range to be simulated, modeling the interconnect with a symmetric lumped transmission line model, and defining a resistance value of the lumped transmission line model to be about 1.05-1.3 times the resistance value taken from the database.