Invention Grant
- Patent Title: Sampling position-fixing system
- Patent Title (中): 取样位置固定系统
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Application No.: US13151585Application Date: 2011-06-02
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Publication No.: US09098745B2Publication Date: 2015-08-04
- Inventor: Yoriko Kazama , Osamu Nishiguchi , Masaaki Tanizaki
- Applicant: Yoriko Kazama , Osamu Nishiguchi , Masaaki Tanizaki
- Applicant Address: JP Tokyo
- Assignee: HITACHI SOLUTIONS, LTD.
- Current Assignee: HITACHI SOLUTIONS, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Baker Botts L.L.P.
- Priority: JP2010-128406 20100604
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06K9/00 ; G06K9/46

Abstract:
In the case of collecting samples, it is difficult to select a representative point of a target area. Thus, the samples are collected from certain positions, resulting in generation of variations of data. The target area is specified on an image to extract features from the target area. Further, clustering is performed for the features on a feature space to obtain representative features, and the obtained representative features are extracted as sampling points.
Public/Granted literature
- US20110299786A1 SAMPLING POSITION-FIXING SYSTEM Public/Granted day:2011-12-08
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