Invention Grant
US09099211B2 Prompt gamma-ray detection apparatus for analyzing chemical materials using femtosecond pulse laser-induced neutrons
有权
用于分析使用飞秒脉冲激光诱导中子的化学物质的伽马射线检测装置
- Patent Title: Prompt gamma-ray detection apparatus for analyzing chemical materials using femtosecond pulse laser-induced neutrons
- Patent Title (中): 用于分析使用飞秒脉冲激光诱导中子的化学物质的伽马射线检测装置
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Application No.: US13325322Application Date: 2011-12-14
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Publication No.: US09099211B2Publication Date: 2015-08-04
- Inventor: Kwon-Hae Yea , HyungKi Cha , Sung-Man Lee , Sang-Soon Park , Seong Hee Park
- Applicant: Kwon-Hae Yea , HyungKi Cha , Sung-Man Lee , Sang-Soon Park , Seong Hee Park
- Applicant Address: KR Daejeon
- Assignee: Korea Atomic Energy Research Institute
- Current Assignee: Korea Atomic Energy Research Institute
- Current Assignee Address: KR Daejeon
- Agency: Fredrikson & Byron, P.A.
- Priority: KR10-2010-0130687 20101220
- Main IPC: G21G1/06
- IPC: G21G1/06 ; G01N23/222

Abstract:
Disclosed herein is a prompt gamma-ray detection apparatus for analyzing chemical materials using femtosecond pulse laser-induced neutrons, which can be effectively used in the nondestructive inspection of various materials, such as metals, coal, cement, radioactive materials and the like as well as explosives and chemical materials, and which can provide better measurement results for the analysis of basic materials, and a method of measuring prompt gamma-rays using the apparatus. The prompt gamma-ray detection apparatus is advantageous because it can non-destructively analyze the elements in a chemical sample using a femtosecond pulse laser-induced neutron generator that solves the problems of an atomic reactor for research or a radioactive isotope as a neutron radiation source.
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