Invention Grant
US09100112B1 Latency built-in self-test 有权
延迟内置自检

Latency built-in self-test
Abstract:
Techniques and mechanisms determine latencies of transmitters of transceivers and use the determined latencies to adjust latencies of the transmitters. For example, a test pattern may be used to determine a first transmitter has a higher latency than a second transmitter. The second transmitter may be provided data indicating a delay to increase its latency such that it matches the first transmitter.
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