Invention Grant
- Patent Title: Latency built-in self-test
- Patent Title (中): 延迟内置自检
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Application No.: US14331973Application Date: 2014-07-15
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Publication No.: US09100112B1Publication Date: 2015-08-04
- Inventor: Han Hua Leong , Yanjing Ke
- Applicant: Altera Corporation
- Applicant Address: US CA San Jose
- Assignee: Altera Corporation
- Current Assignee: Altera Corporation
- Current Assignee Address: US CA San Jose
- Agency: Weaver Austin Villeneuve & Sampson LLP
- Main IPC: H04B3/46
- IPC: H04B3/46 ; H04B17/00

Abstract:
Techniques and mechanisms determine latencies of transmitters of transceivers and use the determined latencies to adjust latencies of the transmitters. For example, a test pattern may be used to determine a first transmitter has a higher latency than a second transmitter. The second transmitter may be provided data indicating a delay to increase its latency such that it matches the first transmitter.
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