Invention Grant
US09100862B2 Test signal generation apparatus and method based on LTE-advanced system
有权
基于LTE高级系统的测试信号发生装置和方法
- Patent Title: Test signal generation apparatus and method based on LTE-advanced system
- Patent Title (中): 基于LTE高级系统的测试信号发生装置和方法
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Application No.: US14083500Application Date: 2013-11-19
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Publication No.: US09100862B2Publication Date: 2015-08-04
- Inventor: Takashi Matsumoto , Yoshihiro Shiozawa
- Applicant: ANRITSU CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: ANRITSU CORPORATION
- Current Assignee: ANRITSU CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Pearne & Gordon LLP
- Priority: JP2013-034862 20130225
- Main IPC: H04W24/00
- IPC: H04W24/00 ; H04W24/06 ; H04B17/00

Abstract:
To provide a technique for simplifying a parameter setting process required to generate a test signal based on an LTE-Advanced system. Carrier arrangement designation means 25 displays a screen for selecting one of an intra-band type or an inter-band type as the arrangement of a plurality of component carriers used in an LTE-Advanced system such that one of the intra-band type or the inter-band type is designated. Parameter file designation means 26 designates a parameter file to be allocated to the component carrier among test signal generating parameter files stored in a parameter file storage means 24. Parameter and frequency band allocation means 27 designates the component carrier to which the designated parameter file can be allocated and the allocated frequency band for communication in which the component carriers are arranged.
Public/Granted literature
- US20140242919A1 TEST SIGNAL GENERATION APPARATUS AND METHOD BASED ON LTE-ADVANCED SYSTEM Public/Granted day:2014-08-28
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