Invention Grant
- Patent Title: X-ray imaging apparatus and imaging method
- Patent Title (中): X射线成像装置及成像方法
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Application No.: US13376576Application Date: 2011-06-20
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Publication No.: US09101322B2Publication Date: 2015-08-11
- Inventor: Taihei Mukaide , Nao Nakatsuji
- Applicant: Taihei Mukaide , Nao Nakatsuji
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA Inc. IP Division
- Priority: JP2010-158133 20100712
- International Application: PCT/JP2011/064606 WO 20110620
- International Announcement: WO2012/008287 WO 20120119
- Main IPC: G01N23/04
- IPC: G01N23/04 ; A61B6/00 ; G01N23/20 ; G21K1/04

Abstract:
An X-ray imaging apparatus and an imaging method capable of acquiring an image of a test object associated with a phase shift in consideration of X-ray absorption is provided. A splitting element configured to spatially split an X-ray into multiple X-ray beams is provided. A shielding unit including a plurality of shielding elements configured to block part of an X-ray acquired by the splitting element is provided. Part of X-ray beams detected at the first detection pixels is blocked by the shielding elements. The X-ray beams detected by the second detection pixels adjoining the first detection pixels are not blocked by the shielding elements.
Public/Granted literature
- US20120148023A1 X-RAY IMAGING APPARATUS AND IMAGING METHOD Public/Granted day:2012-06-14
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