Invention Grant
- Patent Title: Measurement system of a light source in space
- Patent Title (中): 空间光源测量系统
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Application No.: US13810455Application Date: 2011-07-14
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Publication No.: US09103661B2Publication Date: 2015-08-11
- Inventor: Eric Grenet , Peter Masa , Edoardo Franzi , David Hasler
- Applicant: Eric Grenet , Peter Masa , Edoardo Franzi , David Hasler
- Applicant Address: CH Neuchatel
- Assignee: CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE SA—RECHERCHE ET DEVELOPPMENT
- Current Assignee: CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE SA—RECHERCHE ET DEVELOPPMENT
- Current Assignee Address: CH Neuchatel
- Agency: Young & Thompson
- International Application: PCT/EP2011/062104 WO 20110714
- International Announcement: WO2012/007561 WO 20120119
- Main IPC: G01B11/14
- IPC: G01B11/14 ; G01C3/08 ; G01D5/34 ; G01D5/38 ; G01S1/70 ; G01S3/781 ; G01S3/783
Abstract:
A system measures the position of a light source in space using an imager and transparent surface with a pattern on top. The pattern consists of a repetitive pattern and a distinctive element. The system achieves sub-micron precision. It also handles the measurement of several light sources simultaneously, and the measurement of the position of a retroreflector instead of the light.
Public/Granted literature
- US20130120763A1 MEASUREMENT SYSTEM OF A LIGHT SOURCE IN SPACE Public/Granted day:2013-05-16
Information query
