Invention Grant
- Patent Title: X-ray imaging apparatus and X-ray imaging method
- Patent Title (中): X射线成像装置和X射线成像方法
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Application No.: US13121776Application Date: 2010-07-23
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Publication No.: US09103923B2Publication Date: 2015-08-11
- Inventor: Masatoshi Watanabe , Taihei Mukaide , Kazuhiro Takada , Kazunori Fukuda
- Applicant: Masatoshi Watanabe , Taihei Mukaide , Kazuhiro Takada , Kazunori Fukuda
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA Inc. IP Division
- Priority: JP2009-173452 20090724
- International Application: PCT/JP2010/062972 WO 20100723
- International Announcement: WO2011/010750 WO 20110127
- Main IPC: G01T1/202
- IPC: G01T1/202 ; G01N23/223 ; G01T1/164

Abstract:
An X-ray imaging apparatus and an X-ray imaging method for use in the X-ray imaging apparatus are provided. The X-ray imaging apparatus includes a separating element configured to spatially separate an X-ray generated by an X-ray generator unit and a scintillator array including a plurality of first scintillators arranged therein, where the separated X-rays are made incident on the first scintillators. Each of the first scintillators is configured to vary an intensity of fluorescence induced by the X-ray in accordance with an incident position of the X-ray. The X-ray imaging apparatus further includes a detector configured to detect the intensity of fluorescence emitted from the scintillator array.
Public/Granted literature
- US20110176662A1 X-RAY IMAGING APPARATUS AND X-RAY IMAGING METHOD Public/Granted day:2011-07-21
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