Invention Grant
US09106771B2 Image inspection device, image inspection system, and image inspection method
有权
图像检测装置,图像检查系统和图像检查方法
- Patent Title: Image inspection device, image inspection system, and image inspection method
- Patent Title (中): 图像检测装置,图像检查系统和图像检查方法
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Application No.: US14205968Application Date: 2014-03-12
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Publication No.: US09106771B2Publication Date: 2015-08-11
- Inventor: Tadashi Kitai
- Applicant: Tadashi Kitai
- Applicant Address: JP Tokyo
- Assignee: RICOH COMPANY, LIMITED
- Current Assignee: RICOH COMPANY, LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2013-053950 20130315; JP2014-020130 20140205
- Main IPC: H04N1/00
- IPC: H04N1/00 ; H04N1/60

Abstract:
An image inspection device includes: a read-image acquiring unit that acquires a read image of a formed and output image; an inspection-image generating unit that generates an inspection image used for inspection of the read image on the basis of information of an image to be formed and output acquired from an image processing apparatus that corrects density of the image according to a state of an image forming apparatus, and generates the information; and an inspection-result acquiring unit that acquires a result of determination of a defect in the read image based on a difference between the inspection image and the read image. The inspection-image generating unit acquires density correction information in which densities before and after density of the image is corrected are associated, and generates the inspection image corresponding to density before corrected, on the basis of the acquired density correction information.
Public/Granted literature
- US20140268259A1 IMAGE INSPECTION DEVICE, IMAGE INSPECTION SYSTEM, AND IMAGE INSPECTION METHOD Public/Granted day:2014-09-18
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