An ECU executes a program including the steps of: obtaining a first temperature Ta of a first semiconductor element; obtaining a second temperature Tb of a third semiconductor element; determining that it is in a normal state in which clogging has not occurred, when a rotating speed Nm2 of a second MG is more than a threshold value Nm2 and the magnitude of a difference between the first temperature Ta and the second temperature Tb is less than a threshold value ΔT; and determining that the clogging of a foreign matter has occurred in a predetermined site when the magnitude of the difference between the first temperature Ta and the second temperature Tb is equal to or more than the threshold value ΔT.