Invention Grant
- Patent Title: Memory cell with improved write margin
- Patent Title (中): 具有改善写入容限的存储单元
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Application No.: US13997633Application Date: 2012-03-30
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Publication No.: US09111600B2Publication Date: 2015-08-18
- Inventor: Yih Wang , Muhammad M. Khellah , Fatih Hamzaoglu
- Applicant: Yih Wang , Muhammad M. Khellah , Fatih Hamzaoglu
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Green, Howard & Mughal, LLP
- International Application: PCT/US2012/031455 WO 20120330
- International Announcement: WO2013/147848 WO 20131003
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C5/14 ; G11C11/413

Abstract:
Described is an apparatus and system for improving write margin in memory cells. In one embodiment, the apparatus comprises: a first circuit to provide a pulse signal with a width; and a second circuit to receive the pulse signal and to generate a power supply for the memory cell, wherein the second circuit to reduce a level of the power supply below a data retention voltage level of the memory cell for a time period corresponding to the width of the pulse signal. In one embodiment, the apparatus comprises a column of memory cells having a high supply node and a low supply node; and a charge sharing circuit positioned in the column of memory cells, the charge sharing circuit coupled to the high and low supply nodes, the charge sharing circuit operable to reduce direct-current (DC) power consumption.
Public/Granted literature
- US20140003181A1 MEMORY CELL WITH IMPROVED WRITE MARGIN Public/Granted day:2014-01-02
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