Invention Grant
- Patent Title: Global bit line pre-charge circuit that compensates for process, operating voltage, and temperature variations
- Patent Title (中): 全局位线预充电电路,用于补偿过程,工作电压和温度变化
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Application No.: US13935105Application Date: 2013-07-03
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Publication No.: US09117495B2Publication Date: 2015-08-25
- Inventor: Chang Hua Siau , Bruce Lynn Bateman
- Applicant: UNITY SEMICONDUCTOR CORPORATION
- Applicant Address: US CA Sunnyvale
- Assignee: Unity Semiconductor Corporation
- Current Assignee: Unity Semiconductor Corporation
- Current Assignee Address: US CA Sunnyvale
- Agency: Stolowitz Ford Cowger LLP
- Main IPC: G11C5/06
- IPC: G11C5/06 ; G11C5/08 ; G11C7/00 ; G11C7/18 ; G11C13/00 ; G11C7/04 ; G11C7/12 ; G11C16/24

Abstract:
A memory array includes wordlines, local bitlines, two-terminal memory elements, global bitlines, and local-to-global bitline pass gates and gain stages. The memory elements are formed between the wordlines and local bitlines. Each local bitline is selectively coupled to an associated global bitline, by way of an associated local-to-global bitline pass gate. During a read operation when a memory element of a local bitline is selected to be read, a local-to-global gain stage is configured to amplify a signal on or passing through the local bitline to an amplified signal on or along an associated global bitline. The amplified signal, which in one embodiment is dependent on the resistive state of the selected memory element, is used to rapidly determine the memory state stored by the selected memory element. The global bit line and/or the selected local bit line can be biased to compensate for the Process Voltage Temperature (PVT) variation.
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