Invention Grant
- Patent Title: Nanoporous structures by reactive ion etching
- Patent Title (中): 纳米孔结构通过反应离子蚀刻
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Application No.: US13920125Application Date: 2013-06-18
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Publication No.: US09117652B2Publication Date: 2015-08-25
- Inventor: Yann Astier , Jingwei Bai , Robert L. Bruce , Aaron D. Franklin , Joshua T. Smith
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent L. Jeffrey Kelly; Louis J. Percello
- Main IPC: C23F4/00
- IPC: C23F4/00 ; H01L21/02 ; G01N27/414 ; B82Y40/00 ; B82B3/00 ; B82Y15/00

Abstract:
A method for forming porous metal structures and the resulting structure may include forming a metal structure above a substrate. A masking layer may be formed above the metal structure, and then etched using a reactive ion etching process with a mask etchant and a metal etchant. Etching the masking layer may result in the formation of a plurality of pores in the metal structure. In some embodiments, the metal structure may include a first end region, a second end region, and an intermediate region. Before etching the masking layer, a protective layer may be formed above the first end region and the second end region, so that the plurality of pores is contained within the intermediate region. In some embodiments, the intermediate metal region may be a nanostructure such as a nanowire.
Public/Granted literature
- US20140370326A1 NANOPOROUS STRUCTURES BY REACTIVE ION ETCHING Public/Granted day:2014-12-18
Information query
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