Invention Grant
US09121697B2 Wear amount measuring device, wear amount measuring method, wear amount measuring program and storage medium
有权
磨损量测量装置,磨损量测量方法,磨损量测量程序和存储介质
- Patent Title: Wear amount measuring device, wear amount measuring method, wear amount measuring program and storage medium
- Patent Title (中): 磨损量测量装置,磨损量测量方法,磨损量测量程序和存储介质
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Application No.: US13509770Application Date: 2011-01-19
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Publication No.: US09121697B2Publication Date: 2015-09-01
- Inventor: Shigeto Marumoto , Hideyuki Wakai , Yukihiro Suzaki , Daijirou Itou , Tomoyuki Tsubaki , Kenichi Hisamatsu
- Applicant: Shigeto Marumoto , Hideyuki Wakai , Yukihiro Suzaki , Daijirou Itou , Tomoyuki Tsubaki , Kenichi Hisamatsu
- Applicant Address: JP Tokyo
- Assignee: KOMATSU LTD.
- Current Assignee: KOMATSU LTD.
- Current Assignee Address: JP Tokyo
- Agency: Global IP Counselors, LLP
- Priority: JP2010-027146 20100210
- International Application: PCT/JP2011/050803 WO 20110119
- International Announcement: WO2011/099337 WO 20110818
- Main IPC: G09G5/00
- IPC: G09G5/00 ; G01B21/20 ; G01B11/24

Abstract:
A wear amount measuring device includes an image display unit, an image processing unit, and a wear amount computing unit. The image display unit displays a real object image based on real object image data containing a wear amount measurement target and a reference part, and displays a plan image based on design plan data containing the wear amount measurement target and the reference part. The image processing unit executes an image processing of overlapping the real object image and the plan image at an equal scale on a corresponding positional relation when the reference parts are matched. The wear amount computing unit computes a wear amount based on a magnitude of an interval between a measurement contour line drawn along a contour of the wear amount measurement target in the real object image and a plan contour line in the plan image.
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