Invention Grant
- Patent Title: Sensor for simultaneous measurement of thickness and lateral position of a transparent object
- Patent Title (中): 用于同时测量透明物体的厚度和横向位置的传感器
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Application No.: US13788507Application Date: 2013-03-07
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Publication No.: US09121705B2Publication Date: 2015-09-01
- Inventor: Dean Marko Ljubicic , Brian W. Anthony
- Applicant: Massachusetts Insititute of Technology
- Applicant Address: US MA Cambridge
- Assignee: Massachusetts Institute of Technology
- Current Assignee: Massachusetts Institute of Technology
- Current Assignee Address: US MA Cambridge
- Agency: MIT Technology Licensing Office
- Agent Sam Pasternack
- Main IPC: G01C11/02
- IPC: G01C11/02 ; G01B11/06 ; G01B11/02 ; G01B9/02

Abstract:
System for measuring thickness and lateral position of a transparent object. The system includes a camera having a sensor for receiving light, the camera including an objective lens for focusing on an object plane and having an optical axis and a field of view. A source of light is provided to illuminate a surface having variations in reflected light intensity. The surface is spaced apart from the objective lens and disposed at an angle with respect to the optical axis of the objective lens. A transparent object disposed fully or partially between the objective lens and the surface will shift the position of the object plane, the shift in object plane being proportional to the thickness of the object, and the transparent object, when partially inserted between the objective lens and the surface, will focus a fraction of the light on a lower plane, this fraction of light being proportional to the fraction of the lens field of view occupied by the transparent object that is related to lateral position.
Public/Granted literature
- US20130278756A1 Sensor for Simultaneous Measurement of Thickness and Lateral Position of a Transparent Object Public/Granted day:2013-10-24
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