Invention Grant
- Patent Title: Arrangements for detecting light of different wavelength at different angles
- Patent Title (中): 用于在不同角度检测不同波长的光的布置
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Application No.: US14021065Application Date: 2013-09-09
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Publication No.: US09121759B2Publication Date: 2015-09-01
- Inventor: Peter Roentgen , Markus Rossi
- Applicant: Heptagon Micro Optics Pte. Ltd.
- Applicant Address: SG Singapore
- Assignee: Heptagon Micro Optics Pte. Ltd.
- Current Assignee: Heptagon Micro Optics Pte. Ltd.
- Current Assignee Address: SG Singapore
- Agency: Fish & Richardson P.C.
- Main IPC: G01J5/02
- IPC: G01J5/02 ; H01L27/00 ; G01J1/04 ; G01J1/06 ; G01J3/36 ; G01J3/02 ; G01J1/42

Abstract:
Disclosed is an arrangement for detecting first light (L1) and second light (L2), with the first light (L1) and second light (L2) having no wavelength in common. The arrangement includes a first effective detector area (D1) and a second effective detector area (D2). The first effective detector area (D1) is exposed to the first light (L1) and/or second light (L2) different from the first light (L1) and/or second light (L2) to which the second effective detector area (D2) is exposed when the arrangement is exposed to spatially uniformly distributed first light (L1) and second light (L2). The difference between the first light (L1) and/or second light (L2) to which said first detector area (D1) and second detector area (D2) are exposed to can be a difference in intensity and/or difference in an angle of incidence relative to the arrangement.
Public/Granted literature
- US20140027623A1 ARRANGEMENTS FOR DETECTING LIGHT OF DIFFERENT WAVELENGTH AT DIFFERENT ANGLES Public/Granted day:2014-01-30
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