Invention Grant
- Patent Title: Method of testing anti-high temperature performance of a magnetic head and apparatus thereof
- Patent Title (中): 测试磁头抗高温性能的方法及其装置
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Application No.: US13064994Application Date: 2011-04-29
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Publication No.: US09121888B2Publication Date: 2015-09-01
- Inventor: Chiuming Lueng , Cheukman Lui , Mankit Lee , Hokei Lam , Kwokkam Leung , Cheukwing Leung , Juren Ding , Rongkwang Ni
- Applicant: Chiuming Lueng , Cheukman Lui , Mankit Lee , Hokei Lam , Kwokkam Leung , Cheukwing Leung , Juren Ding , Rongkwang Ni
- Applicant Address: CN Hong Kong
- Assignee: SAE MAGNETICS (H.K.) LTD.
- Current Assignee: SAE MAGNETICS (H.K.) LTD.
- Current Assignee Address: CN Hong Kong
- Agency: Nixon & Vanderhye PC
- Main IPC: G01R33/12
- IPC: G01R33/12 ; G11B5/455 ; B82Y25/00 ; G11B27/36

Abstract:
A method of testing anti-high temperature performance of a magnetic head comprises applying a second magnetic field with different intensities in a second direction and the changing first magnetic fields in a first direction, and measuring a plurality of second output parameter curves; and judging whether a variation that is beyond an allowable value is presented on the second output parameter curves, thereby screening out a defective magnetic head, therein the first direction is perpendicular to the air bearing surface of the magnetic head, and the second direction is perpendicular to the shielding layers of the magnetic head. The present invention can screen out defective magnetic heads that possess poor anti-high temperature performance without heating the magnetic head and with high precision.
Public/Granted literature
- US20120274317A1 Method of testing anti-high temperature performance of a magnetic head and apparatus thereof Public/Granted day:2012-11-01
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