A circuit system for testing a chip is provided. The circuit system includes a first layer coupled with a plurality of ground communication mediums. Each ground communication medium facilitates communication of a ground signal. The circuit system includes a second layer coupled with a first integrated circuit chip. The second layer is coupled with a plurality of radio frequency (RF) communication mediums. The RF communication mediums facilitate communication of RF signals. The first integrated circuit chip communicates via one of the RF signals and the ground signal with a second integrated circuit chip. The first and second layers are used to probe the RF signals and the ground signal.