Invention Grant
US09121904B2 Tap linking module test access port controller with enable input
有权
点击链接模块测试访问端口控制器与启用输入
- Patent Title: Tap linking module test access port controller with enable input
- Patent Title (中): 点击链接模块测试访问端口控制器与启用输入
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Application No.: US14559305Application Date: 2014-12-03
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Publication No.: US09121904B2Publication Date: 2015-09-01
- Inventor: Lee D. Whetsel
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Lawrence J. Bassuk; Frank D. Cimino
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/3177 ; G01R31/3185
Abstract:
An integrated circuit can have plural core circuits, each having a test access port that is defined in IEEE standard 1149.1. Access to and control of these ports is though a test linking module. The test access ports on an integrated circuit can be arranged in a hierarchy with one test linking module controlling access to plural secondary test linking modules and test access ports. Each secondary test linking module in turn can also control access to tertiary test linking modules and test access ports. The test linking modules can also be used for emulation.
Public/Granted literature
- US20150089313A1 HIERARCHICAL ACCESS OF TEST ACCESS PORTS IN EMBEDDED CORE INTEGRATED CIRCUITSGB Public/Granted day:2015-03-26
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