Invention Grant
- Patent Title: Dual mode balancing in OBM resistivity imaging
- Patent Title (中): OBM电阻率成像中的双模平衡
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Application No.: US14098178Application Date: 2013-12-05
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Publication No.: US09121963B2Publication Date: 2015-09-01
- Inventor: Alexandre N. Bespalov , Gregory B. Itskovich
- Applicant: Baker Hughes Incorporated
- Applicant Address: US TX Houston
- Assignee: BAKER HUGHES INCORPORATED
- Current Assignee: BAKER HUGHES INCORPORATED
- Current Assignee Address: US TX Houston
- Agency: Mossman Kumar & Tyler PC
- Main IPC: G01V3/00
- IPC: G01V3/00 ; G01N27/72 ; G01R33/02 ; G01V3/26 ; E21B47/12 ; G01V3/20 ; G01V3/18 ; G01V3/08

Abstract:
Methods, systems, and devices for evaluating an earth formation. Methods may include conveying the carrier into a formation borehole; and using measure electrodes, in one mode of measurement, to make current measurements by applying a voltage to each measure electrode in a first set of sensor arrays while making first current measurements; and applying another high frequency voltage to each measure electrode in a second set of sensor arrays while making second current measurements. Optionally, methods include using the measure electrodes, in another mode of measurement, to make further resistivity measurements by applying a voltage to each measure electrode in both sets of sensor arrays while making third current measurements. Methods include combining first current measurements, second current measurements, and third current measurements to simulate a virtual impedance for each measure electrode. Optionally, any two consecutive sensor arrays around the circumference of the tool body are in different sets.
Public/Granted literature
- US20150160366A1 DUAL MODE BALANCING IN OBM RESISTIVITY IMAGING Public/Granted day:2015-06-11
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