Invention Grant
- Patent Title: Pattern forming process
- Patent Title (中): 图案形成过程
-
Application No.: US14156538Application Date: 2014-01-16
-
Publication No.: US09122147B2Publication Date: 2015-09-01
- Inventor: Jun Hatakeyama , Tsutomu Ogihara
- Applicant: SHIN-ETSU CHEMICAL CO., LTD.
- Applicant Address: JP Tokyo
- Assignee: SHIN-ESTU CHEMICAL CO., LTD.
- Current Assignee: SHIN-ESTU CHEMICAL CO., LTD.
- Current Assignee Address: JP Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2013-027883 20130215
- Main IPC: G03F7/26
- IPC: G03F7/26 ; G03F7/00 ; G03F7/32 ; G03F7/20 ; G03F7/40 ; H01L21/027

Abstract:
A pattern is formed by coating a resist composition comprising a resin comprising recurring units having an acid labile group, a photoacid generator, and a first organic solvent onto a processable substrate, prebaking, exposing, PEB, and developing in an organic solvent developer to form a negative pattern; heating the negative pattern to render it resistant to a second organic solvent; coating a solution of a resin having a carbon content of at least 75 wt % in the second organic solvent thereon, prebaking, and dry etching to effect image reversal for converting the negative pattern into a positive pattern.
Public/Granted literature
- US20140235057A1 PATTERN FORMING PROCESS Public/Granted day:2014-08-21
Information query
IPC分类: