Invention Grant
- Patent Title: Compositions and processes for photolithography
- Patent Title (中): 光刻的组成和工艺
-
Application No.: US13445442Application Date: 2012-04-12
-
Publication No.: US09122159B2Publication Date: 2015-09-01
- Inventor: Deyan Wang , Chunyi Wu
- Applicant: Deyan Wang , Chunyi Wu
- Assignee: Rohm and Haas Electronic Materials LLC
- Current Assignee: Rohm and Haas Electronic Materials LLC
- Main IPC: G03F7/11
- IPC: G03F7/11 ; G03F7/004 ; G03F7/20

Abstract:
Topcoat layer compositions suitable for use in forming a topcoat layer over a layer of photoresist include: a matrix polymer which is aqueous alkali soluble; a first additive of mer which is aqueous alkali soluble and comprises polymerized units of a monomer of the following general formula (I): wherein: R1 is hydrogen or a C1 to C6 alkyl or fluoroalkyl group; R2 is a C3 to C8 branched alkylene group; and R3 is a C1 to C4 fluoroalkyl group; and wherein the first additive polymer is present in the composition in an amount less than the matrix polymer, and the first additive polymer has a lower surface energy than a surface energy of the matrix polymer; wherein a layer of the topcoat composition in a dried state has a water receding contact angle of from 75 to 85°. The compositions find particular applicability to immersion lithography processing.
Public/Granted literature
- US20120264053A1 COMPOSITIONS AND PROCESSES FOR PHOTOLITHOGRAPHY Public/Granted day:2012-10-18
Information query
IPC分类: