Invention Grant
- Patent Title: Interference checking device and numerical control apparatus
- Patent Title (中): 干扰检查装置和数控装置
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Application No.: US14000272Application Date: 2013-02-21
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Publication No.: US09122267B2Publication Date: 2015-09-01
- Inventor: Toshiyuki Morita , Nobuyuki Takahashi , Tadahiro Otsuka
- Applicant: Mitsubishi Electronic Corporation
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Agent Richard C. Turner
- International Application: PCT/JP2013/054376 WO 20130221
- International Announcement: WO2014/128890 WO 20140828
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G05B19/4061 ; G06T7/60

Abstract:
An interference checking device includes a contour shape analyzing unit that extracts a contour shape of a tool cross section and a tool length by analyzing a two-dimensional image of a rotating tool, a rotation center analyzing unit that obtains a rotation center of the rotating tool by analyzing the contour shape, a three-dimensional-rotation-shape generating unit that generates a three-dimensional shape of the rotating tool on the basis of the contour shape, the tool length, and the rotation center, and an interference check processing unit that checks whether the rotating tool and a component other than the rotating tool interfere with each other when numerical control machining is performed on a workpiece by using the rotating tool, by using the three-dimensional shape, in which the three-dimensional-rotation-shape generating unit generates the three-dimensional shape by using a left-side contour shape.
Public/Granted literature
- US20140233839A1 INTERFERENCE CHECKING DEVICE AND NUMERICAL CONTROL APPARATUS Public/Granted day:2014-08-21
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