Invention Grant
- Patent Title: Failure cause diagnosis system and method
- Patent Title (中): 故障原因诊断系统及方法
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Application No.: US13578034Application Date: 2010-02-26
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Publication No.: US09122273B2Publication Date: 2015-09-01
- Inventor: Hiroki Uchiyama , Shinya Yuda , Hideaki Suzuki , Kozo Nakamura
- Applicant: Hiroki Uchiyama , Shinya Yuda , Hideaki Suzuki , Kozo Nakamura
- Applicant Address: JP Tokyo
- Assignee: HITACHI, LTD.
- Current Assignee: HITACHI, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Baker Botts L.L.P.
- International Application: PCT/JP2010/001303 WO 20100226
- International Announcement: WO2011/104760 WO 20110901
- Main IPC: G06F15/00
- IPC: G06F15/00 ; G05B23/02

Abstract:
The invention is related to a system and a method to determine whether a target equipment deviates from a normal state. If it is determined that the target equipment to be diagnosed deviates from the normal state, the degree of deviation of each parameter from the normal state as the reference is calculated as an abnormal contribution ratio. A failure cause is estimated from a similarity ratio between the calculated abnormal contribution ratio and the abnormal contribution ratio of each of the failure causes collected in the past and including failure phenomena and failure parts.
Public/Granted literature
- US20120310597A1 FAILURE CAUSE DIAGNOSIS SYSTEM AND METHOD Public/Granted day:2012-12-06
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