Invention Grant
- Patent Title: Automatic quantification of asymmetry
- Patent Title (中): 自动量化不对称性
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Application No.: US13977025Application Date: 2012-01-03
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Publication No.: US09123101B2Publication Date: 2015-09-01
- Inventor: Frank Olaf Thiele
- Applicant: Frank Olaf Thiele
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips N.V.
- Current Assignee: Koninklijke Philips N.V.
- Current Assignee Address: NL Eindhoven
- International Application: PCT/IB2012/050025 WO 20120103
- International Announcement: WO2012/093353 WO 20120712
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G06T7/60 ; A61B5/00

Abstract:
An apparatus detects asymmetry in an object, such as a brain. The apparatus includes a processor programmed to fit a three-dimensional image of the object to a preselected shape, such as a standard brain atlas. The processor projects the three-dimensional image of the object to a two-dimensional surface image. The processor compares corresponding mirror image symmetric voxel pairs on the left and right sides of the surface image. The processor generates at least one of an asymmetry map and an asymmetry index based on the deviations in the pixel pairs. The processor can also mask, before the comparison, pixels of the surface image which are asymmetric in a normal brain.
Public/Granted literature
- US20130289395A1 AUTOMATIC QUANTIFICATION OF ASYMMETRY Public/Granted day:2013-10-31
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