Invention Grant
- Patent Title: Testing device
- Patent Title (中): 测试装置
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Application No.: US13609260Application Date: 2012-09-11
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Publication No.: US09123442B2Publication Date: 2015-09-01
- Inventor: Quan Li , Kuan-Han Chen , Yin-Ching Wu
- Applicant: Quan Li , Kuan-Han Chen , Yin-Ching Wu
- Applicant Address: TW New Taipei
- Assignee: Wistron Corporation
- Current Assignee: Wistron Corporation
- Current Assignee Address: TW New Taipei
- Agency: Jianq Chyun IP Office
- Priority: CN201210230545 20120704
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G11C29/02 ; G06F11/22 ; G11C29/56

Abstract:
A testing device including a first connector, a control unit, a first detecting circuit and a memory controller is provided. The first connector is electrically connected to a first bus. The control unit generates a plurality of first control signals according to a first enable signal from the first connector. The first detecting circuit is electrically connected to a plurality of first transmission lines in the first bus, and sequentially conducts the first transmission lines to a ground according to the first control signals. The memory controller detects states of the signals transmitted by the first transmission lines and determines whether to generate a first abnormal indication signal according to a detecting result. The control unit controls a plurality of indication lights according to the first abnormal indication signal.
Public/Granted literature
- US20140009179A1 TESTING DEVICE Public/Granted day:2014-01-09
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