Invention Grant
- Patent Title: Method and apparatus for memory speed characterization
- Patent Title (中): 用于记忆速度表征的方法和装置
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Application No.: US13584217Application Date: 2012-08-13
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Publication No.: US09123446B1Publication Date: 2015-09-01
- Inventor: Reuven Ecker
- Applicant: Reuven Ecker
- Applicant Address: IL Yokneam
- Assignee: Marvell Israel (M.I.S.L) Ltd.
- Current Assignee: Marvell Israel (M.I.S.L) Ltd.
- Current Assignee Address: IL Yokneam
- Main IPC: G11C29/50
- IPC: G11C29/50

Abstract:
Aspects of the disclosure provide an integrated circuit. The integrated circuit includes a memory array, a ring oscillator and a speed determination circuit. The memory array is defined by a plurality of memory cells that are based on a memory cell design. The ring oscillator has a plurality of inversion stages formed of a plurality of modified memory cells based on the memory cell design. The speed determination circuit is configured to determine a speed of the ring oscillator.
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