Invention Grant
US09123446B1 Method and apparatus for memory speed characterization 有权
用于记忆速度表征的方法和装置

Method and apparatus for memory speed characterization
Abstract:
Aspects of the disclosure provide an integrated circuit. The integrated circuit includes a memory array, a ring oscillator and a speed determination circuit. The memory array is defined by a plurality of memory cells that are based on a memory cell design. The ring oscillator has a plurality of inversion stages formed of a plurality of modified memory cells based on the memory cell design. The speed determination circuit is configured to determine a speed of the ring oscillator.
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