Invention Grant
- Patent Title: Semiconductor device
- Patent Title (中): 半导体器件
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Application No.: US14183698Application Date: 2014-02-19
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Publication No.: US09123536B2Publication Date: 2015-09-01
- Inventor: Kentaro Ikeda
- Applicant: Kabushiki Kaisha Toshiba
- Applicant Address: JP Minato-ku
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2013-058840 20130321
- Main IPC: H01L25/18
- IPC: H01L25/18 ; H01L27/02 ; H01L27/085 ; H03K17/567 ; H01L27/06

Abstract:
A semiconductor device of an embodiment is provided with a normally-off transistor having a first source connected to a source terminal, a first drain, and a first gate connected to a gate terminal and a normally-on transistor having a second source connected to the first drain, a second drain connected to a drain terminal, and a second gate connected to the source terminal. A withstand voltage between the first source and the first drain when the normally-off transistor is turned off is lower than a withstand voltage between the second source and the second gate of the normally-on transistor.
Public/Granted literature
- US20140284655A1 SEMICONDUCTOR DEVICE Public/Granted day:2014-09-25
Information query
IPC分类: