Invention Grant
US09123622B2 Atomic layer deposition of high performance anti reflection coatings on delta-doped CCDs
有权
在δ掺杂CCD上的高性能抗反射涂层的原子层沉积
- Patent Title: Atomic layer deposition of high performance anti reflection coatings on delta-doped CCDs
- Patent Title (中): 在δ掺杂CCD上的高性能抗反射涂层的原子层沉积
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Application No.: US14185920Application Date: 2014-02-21
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Publication No.: US09123622B2Publication Date: 2015-09-01
- Inventor: Michael E. Hoenk , Frank Greer , Shouleh Nikzad
- Applicant: Michael E. Hoenk , Frank Greer , Shouleh Nikzad
- Applicant Address: US CA Pasadena
- Assignee: CALIFORNIA INSTITUTE OF TECHNOLOGY
- Current Assignee: CALIFORNIA INSTITUTE OF TECHNOLOGY
- Current Assignee Address: US CA Pasadena
- Agency: Milstein Zhang & Wu LLC
- Agent Joseph B. Milstein
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L27/148 ; H01L27/146 ; H01L31/0216 ; H01L31/101 ; H01L31/18

Abstract:
A back-illuminated silicon photodetector has a layer of Al2O3 deposited on a region of a silicon oxide surface that is left uncovered, while deposition is inhibited in another region by a contact shadow mask. The Al2O3 layer is an antireflection coating. In addition, the Al2O3 layer can also provide a chemically resistant separation layer between the silicon oxide surface and additional antireflection coating layers. In one embodiment, the silicon photodetector has a delta-doped layer near (within a few nanometers of) the silicon oxide surface. The Al2O3 layer is expected to provide similar antireflection properties and chemical protection for doped layers fabricated using other methods, such as MBE, ion implantation and CVD deposition.
Public/Granted literature
- US20140167198A1 ATOMIC LAYER DEPOSITION OF HIGH PERFORMANCE ANTI REFLECTION COATINGS ON DELTA-DOPED CCDS Public/Granted day:2014-06-19
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