Invention Grant
- Patent Title: Amorphous silicon film formation method and amorphous silicon film formation apparatus
- Patent Title (中): 非晶硅膜形成方法和非晶硅膜形成装置
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Application No.: US14656914Application Date: 2015-03-13
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Publication No.: US09123782B2Publication Date: 2015-09-01
- Inventor: Kazuhide Hasebe , Hiroki Murakami , Akinobu Kakimoto
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP
- Agency: Cantor Colburn LLP
- Priority: JP2010-102405 20100427; JP2011-044014 20110301
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/768 ; C23C16/52 ; C23C16/24

Abstract:
An amorphous silicon film formation method includes transferring a base in a process chamber, heating the base in the process chamber, setting a process pressure inside the process chamber, forming a seed layer on a surface of the base by flowing aminosilane-based gas in the process chamber under a process condition in which the aminosilane-based gas is not thermally decomposed and adsorbing the aminosilane-based gas onto the surface of the base, the process condition having a first temperature, and forming an amorphous silicon film on the seed layer by heating the base at a second temperature higher than the first temperature, flowing silane-based gas containing no amino group in the process chamber, and thermally decomposing the silane-based gas containing no amino group, wherein the forming of the seed layer and the forming of the amorphous silicon film are successively performed in the process chamber.
Public/Granted literature
- US20150206795A1 AMORPHOUS SILICON FILM FORMATION METHOD AND AMORPHOUS SILICON FILM FORMATION APPARATUS Public/Granted day:2015-07-23
Information query
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