Invention Grant
- Patent Title: Semiconductor detector with radiation shield
- Patent Title (中): 半导体探测器与辐射屏蔽
-
Application No.: US13906655Application Date: 2013-05-31
-
Publication No.: US09123837B2Publication Date: 2015-09-01
- Inventor: Hans Andersson , Pasi Kostamo , Veikko Kämäräinen , Seppo Nenonen
- Applicant: Oxford Instruments Analytical Oy
- Applicant Address: FI Espoo
- Assignee: Oxford Instruments Analytical Oy
- Current Assignee: Oxford Instruments Analytical Oy
- Current Assignee Address: FI Espoo
- Agency: Harrington & Smith
- Main IPC: H01L31/0216
- IPC: H01L31/0216 ; H01L31/08 ; H01L23/552 ; G01T1/24 ; H01L31/115 ; H01L31/0224

Abstract:
A semiconductor radiation detector includes a bulk layer of semiconductor material. On a first side of said bulk layer is an arrangement of field electrodes and a collection electrode for collecting radiation-induced signal charges from said bulk layer. A radiation shield exists on a second side of said bulk layer, opposite to said first side, which radiation shield selectively overlaps the location of said collection electrode.
Public/Granted literature
- US20140353786A1 SEMICONDUCTOR DETECTOR WITH RADIATION SHIELD Public/Granted day:2014-12-04
Information query
IPC分类: