Invention Grant
US09124529B1 Methods and apparatus for assessing the quality of a data path including both layer-2 and layer-3 devices
有权
用于评估包括第2层和第3层设备的数据路径质量的方法和设备
- Patent Title: Methods and apparatus for assessing the quality of a data path including both layer-2 and layer-3 devices
- Patent Title (中): 用于评估包括第2层和第3层设备的数据路径质量的方法和设备
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Application No.: US13722064Application Date: 2012-12-20
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Publication No.: US09124529B1Publication Date: 2015-09-01
- Inventor: Ankit Chadha
- Applicant: Juniper Networks, Inc.
- Applicant Address: US CA Sunnyvale
- Assignee: Juniper Networks, Inc.
- Current Assignee: Juniper Networks, Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: Cooley LLP
- Main IPC: H04L12/26
- IPC: H04L12/26 ; H04L12/28 ; H04L12/24 ; H04L12/751
Abstract:
In some embodiments, an apparatus includes a layer-2 device operably coupled to a source device and a destination device and disposed within a data path (1) between the source device and the destination device, and (2) includes at least one layer-3 device. The layer-2 device receives a first test data unit from the source device, and defines a quality datum associated with processing the first test data unit. The layer-2 device defines a second test data unit based on the first test data unit that includes the quality datum associated with processing the first test data unit. The layer-2 device sends the second test data unit to the layer-3 device. The layer-3 device defines a quality datum associated with processing the second test data unit at the layer-3 device and defines a third test data unit based on the second test data unit.
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