Invention Grant
- Patent Title: Method of checking an inspection apparatus and method of establishing a measurement variable of the inspection apparatus
- Patent Title (中): 检查装置的检查方法以及建立检查装置的测量变量的方法
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Application No.: US13084949Application Date: 2011-04-12
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Publication No.: US09124810B2Publication Date: 2015-09-01
- Inventor: Hee-Wook You
- Applicant: Hee-Wook You
- Applicant Address: KR Seoul
- Assignee: KOH YOUNG TECHNOLOGY INC.
- Current Assignee: KOH YOUNG TECHNOLOGY INC.
- Current Assignee Address: KR Seoul
- Agency: Kile Park Reed & Houtteman PLLC
- Priority: KR10-2010-0034056 20100414; KR10-2011-0023171 20110316; KR10-2011-0032487 20110408
- Main IPC: H04N7/18
- IPC: H04N7/18 ; H04N5/235 ; G01N21/88 ; G01N21/956 ; H04N13/02

Abstract:
In order to establish a lighting intensity of an inspection apparatus, an inspection board is installed in an inspection apparatus. Then, a width of a histogram of a captured image acquired through a camera of the inspection apparatus is adjusted to avoid from a dark region and a bright region. Thereafter, a lighting intensity of the inspection apparatus is adjusted by adjusting the histogram to be near a middle of a graph. Thus, a setting time of an inspection condition stored in a job file may be reduced to increase the user's convenience, and measurement error due to mis-establishment may be reduced to enhance inspection precision.
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